The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Aug. 08, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chien-Ling Hwang, Hsinchu, TW;

Chung-Jung Wu, Hsinchu, TW;

Tung Li Wu, Hsinchu, TW;

Wei-Chih Chen, Hsinchu County, TW;

Hsu-Chin Tseng, Taoyuan, TW;

Jeng-Nan Hung, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H01L 21/683 (2006.01); H01L 21/687 (2006.01); H01L 23/544 (2006.01); H05B 3/14 (2006.01);
U.S. Cl.
CPC ...
H01L 21/681 (2013.01); H01L 21/6833 (2013.01); H01L 21/68742 (2013.01); H01L 23/544 (2013.01); H05B 3/143 (2013.01); H01L 2223/54426 (2013.01); H05B 2203/002 (2013.01);
Abstract

Disclosed are a bonding system and a bonding method. In one embodiment, the bonding system includes a chamber, first and second electrostatic chucks, a visible light sensor module and a nonvisible light module. The chamber is configured to provide a vacuum state. The first electrostatic chuck is configured to hold a first substrate having a first alignment mark in the chamber, wherein the first electrostatic chuck has a first window. The second electrostatic chuck is configured to hold a second substrate having a second alignment mark in the chamber, wherein the second electrostatic chuck has a second window. The visible light sensor module is configured to capture images of the first and the second alignment marks. The nonvisible light module is configured to capture a combined image of the first and second alignment marks via the first and second windows overlapping each other in the vacuum state.


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