The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2025

Filed:

Sep. 17, 2020
Applicant:

Hangzhou Everfine Photo-e-info Co., Ltd., Zhejiang, CN;

Inventors:

Jiangen Pan, Zhejiang, CN;

Yan Huang, Zhejiang, CN;

Zhijiang Mao, Zhejiang, CN;

Qian Li, Zhejiang, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01J 1/04 (2006.01); G01J 1/08 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01J 1/0474 (2013.01); G01J 1/08 (2013.01); G01J 2001/0481 (2013.01); G01J 3/0254 (2013.01); G01J 3/28 (2013.01); G01M 11/02 (2013.01);
Abstract

An integrating sphere photometer spectral response measurement system has an integrating sphere photometer and three or more reference light sources having different peak wavelengths. The integrating sphere photometer has an integrating sphere and a broadband photodetector, wherein the broadband photodetector is mounted on a sphere wall of the integrating sphere. Emergent light of the reference light sources is incident to the integrating sphere. The total spectral radiation flux Pi(λ)(i=1, 2, . . . n) received by an integrating sphere photometer system is acquired; the response Mi(i=1, 2, . . . n) of a photometer of mixed light in the integrating sphere is read by the broadband photodetector; an equation set is established; and the spectral responsivity Srel(λ) of the integrating sphere photometer is obtained by means of numerical solution.


Find Patent Forward Citations

Pan, Jiangen. (2025). Integrating sphere photometer spectral response measurement method and system (U.S. Patent No. 12498265). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12498265

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…