Memory sub-system initiated burst scan under low power mode

Abstract

A wake up cadence at which the memory device is to wake up during a low power mode is determined. Based on the wake up cadence, a processing device determines a finite number of pages of the memory device to be scanned per wake up during the low power mode to satisfy a criterion for memory device qualification, the criterion being associated with the memory device's data retention capability. Upon detecting the low power mode, a burst scan operation is performed to scan the finite number of pages in the memory device each time the memory device wakes up at the determined cadence.