The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jul. 27, 2020
Applicant:

Globalwafers Japan Co., Ltd., Niigata, JP;

Inventors:

Tatsuhiko Aoki, Niigata, JP;

Manabu Hirasawa, Niigata, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02035 (2013.01); H01L 21/02013 (2013.01); H01L 21/02021 (2013.01); H01L 24/08 (2013.01); H01L 24/80 (2013.01); H01L 2224/08245 (2013.01); H01L 2224/80894 (2013.01);
Abstract

The occurrence of breaking and chipping at the wafer peripheral edge of a bonded wafer obtained by bonding a lamination wafer on a support wafer is suppressed. A lamination wafer to be bonded to a support wafer includes a large-diameter portion made of a silicon wafer whose peripheral edge is chamfered and a small-diameter portion, whose diameter is smaller than that of the large-diameter portion, formed on the large-diameter portion concentrically and integrally with the large-diameter portion, and the small-diameter portion includes a straight body portion whose side surface is perpendicular to the wafer surface, and a neck portion whose side surface is oblique with a predetermined angle to the wafer between the straight body portion and the large-diameter portion, and the small-diameter portion is formed such that the upper face of the straight body portion is to be bonded to the support wafer.


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