The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

May. 23, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chien Ta Huang, Taoyuan, TW;

Chun-Yang Tsai, Hsinchu, TW;

Yi Ching Ong, Hsinchu, TW;

Kuo-Ching Huang, Hsinchu, TW;

Harry-Hak-Lay Chuang, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/367 (2006.01); H01L 21/768 (2006.01); H01L 23/373 (2006.01); H01L 23/528 (2006.01); H01L 25/04 (2023.01); H01L 25/11 (2006.01);
U.S. Cl.
CPC ...
H01L 23/367 (2013.01); H01L 21/76801 (2013.01); H01L 23/3736 (2013.01); H01L 23/528 (2013.01); H01L 25/043 (2013.01); H01L 25/117 (2013.01); H01L 2224/24135 (2013.01); H01L 2924/18161 (2013.01);
Abstract

Some embodiments relate to a method of forming a redistribution layer (RDL) stack of a 3D integrated circuit stack. The method comprises removing a substrate form the first side of a first die to expose a first dielectric layer. A spiral trench is formed in the first dielectric layer with one end of the spiral trench directly over a through silicon via (TSV) beneath the first dielectric layer. A first barrier layer is formed along sidewalls of the spiral trench, the first barrier layer being thermally coupled to the TSV. A first conductive wire is formed within the spiral trench, separated from the first dielectric layer by the barrier layer.


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