The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Aug. 30, 2022
Siemens Industry Software Inc., Plano, TX (US);
Kiarash Ahi, San Jose, CA (US);
Germain Louis Fenger, Gladstone, OR (US);
Hsin-Wei Wu, Heverlee, BE;
Siemens Industry Software Inc., Plano, TX (US);
Abstract
A computing system implementing a raw data filtering tool can aggregate multiple wafer images depicting a portion of an electronic device into a reference image, detect one or more of the wafer images have defects based on a comparison of the reference image to the wafer images, and generate a gauge file to include a set of the wafer images selected based on the detection of defects in the wafer images. The raw data filtering tool also can iteratively build defect maps that include differences between the reference image and the wafer images, and characterize the detected defect in the wafer images with a size and a location based on the defect maps. The raw data filtering tool can provide feedback to a foundry about wafer images were excluded from the set of the wafer images based on the detection of defects in the wafer images.