The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Apr. 18, 2023
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Melvin Verbaas, Austin, TX (US);

Einosuke Tsuda, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 16/458 (2006.01); C23C 16/46 (2006.01); C23C 16/509 (2006.01); C23C 16/52 (2006.01); H01L 21/3065 (2006.01); H01L 21/683 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32715 (2013.01); C23C 16/4583 (2013.01); C23C 16/46 (2013.01); C23C 16/509 (2013.01); C23C 16/52 (2013.01); H01J 37/32568 (2013.01); H01L 21/3065 (2013.01); H01L 21/6833 (2013.01); H01J 37/32082 (2013.01); H01J 2237/002 (2013.01); H01J 2237/2007 (2013.01);
Abstract

An electrostatic chuck (ESC) for holding a workpiece in a plasma processing chamber, where the ESC includes a monolithic insulating substrate with a top surface; a plurality of electrodes embedded in the insulating substrate, the plurality of electrodes being in a multipolar configuration to receive multiple DC bias signals from a first power supply circuit; and a radio frequency (RF) electrode embedded in the insulating substrate, the plurality of electrodes being located between the top surface and the RF electrode, the RF electrode including a contact node configured to be coupled to a second power supply circuit configured to generate an RF signal.


Find Patent Forward Citations

Loading…