The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

May. 10, 2021
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventors:

Norman A. Mertke, San Jose, CA (US);

Himanshu Chokshi, Fremont, CA (US);

Assignee:

LAM RESEARCH CORPORATION, Fremont, CA (US);

Primary Examiner:
Int. Cl.
CPC ...
C23C 14/54 (2006.01); C23C 16/458 (2006.01); C23C 16/46 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
C23C 14/541 (2013.01); C23C 16/4586 (2013.01); C23C 16/463 (2013.01); H01J 37/32697 (2013.01); H01J 37/32724 (2013.01); H01J 2237/2065 (2013.01); H01J 2237/335 (2013.01);
Abstract

A system for controlling a temperature of a substrate during treatment in a substrate processing system comprises a substrate support including first and second components, first and second heaters, and first and second heat sinks. The first component includes an upper surface at least partially defining a center zone. The second component is arranged radially outside of and below the first component. The second component includes an upper surface at least partially defining a radially-outer zone. The first and second components are spaced apart and define a gap between them. The first and second heaters are configured to heat the first and second components, respectively. The first heat sink has one end in thermal communication with the first component. The second heat sink has one end in thermal communication with the second component.


Find Patent Forward Citations

Mertke, Norman. (2025). Temperature-tuned substrate support for substrate processing systems (U.S. Patent No. 12467130). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12467130

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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