The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

May. 30, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Marco Sforzin, Cernusco sul Naviglio, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/108 (2013.01);
Abstract

A memory access method with improved bandwidth efficiency for reliability, availability, and serviceability (RAS) is described. The memory access method includes, in response to a memory access request, obtaining, using a first access granularity, a sub-stripe from a stripe of data stored on a plurality of memory media components arranged in a redundant array of independent data (RAID), and detecting an error in the sub-stripe of the data. The method further includes, in response to the detecting the error, obtaining, using a second access granularity, the stripe of the data from the plurality of memory media components, wherein the second access granularity is larger than the first access granularity. Corresponding devices are also described.


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