The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2025
Filed:
Apr. 26, 2024
Micron Technology, Inc., Boise, ID (US);
Marco Sforzin, Cernusco sul Naviglio, IT;
Micron Technology, Inc., Boise, ID (US);
Abstract
In a locked RAID memory system, the present method generates variable-length compressed data in a RAID stripe, which is stored along with the inclusion of a single RAID parity segment (parity strip) for the entire stripe. If any one data segment (data strip) in the RAID stripe should fail, as determined by a CRC check, the data can be recovered by XORing the single RAID parity segment with all the non-errored data segments in the stripe. However, in order to determine which data segment has failed, successive data segments must be XORed, and the CRC check reperformed, until the CRC error stands corrected. In an embodiment, the successive data segments may be tested in parallel with suitable hardware. In an embodiment, the successive data segments may be tested sequentially, or semi-in-parallel and semi-sequentially.