The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

Aug. 08, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Wei-Yang Lee, Taipei, TW;

Feng-Cheng Yang, Hsinchu County, TW;

Chung-Te Lin, Tainan, TW;

Yen-Ming Chen, Hsin-Chu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 64/66 (2025.01); H01L 21/02 (2006.01); H01L 21/302 (2006.01); H01L 21/311 (2006.01); H10D 30/01 (2025.01); H10D 62/10 (2025.01); H10D 64/01 (2025.01); H10D 64/23 (2025.01); H10D 30/69 (2025.01); H10D 62/822 (2025.01);
U.S. Cl.
CPC ...
H10D 64/679 (2025.01); H01L 21/02068 (2013.01); H01L 21/302 (2013.01); H01L 21/311 (2013.01); H10D 30/0225 (2025.01); H10D 62/115 (2025.01); H10D 64/015 (2025.01); H10D 64/256 (2025.01); H10D 64/671 (2025.01); H10D 30/797 (2025.01); H10D 62/822 (2025.01);
Abstract

A semiconductor device includes a substrate; two source/drain (S/D) regions over the substrate; a gate stack over the substrate and between the two S/D regions; a spacer layer covering sidewalls of the gate stack; an S/D contact metal over one of the two S/D regions; a first dielectric layer covering sidewalls of the S/D contact metal; and an inter-layer dielectric (ILD) layer covering the first dielectric layer, the spacer layer, and the gate stack, thereby defining a gap. A material of a first sidewall of the gap is different from materials of a top surface and a bottom surface of the gap, and a material of a second sidewall of the gap is different from the materials of the top surface and the bottom surface of the gap.


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