The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2025

Filed:

Oct. 28, 2022
Applicant:

Asmpt Singapore Pte. Ltd., Singapore, SG;

Inventors:

Keng Yew Song, Singapore, SG;

Zui Hong Lee, Singapore, SG;

Jian Min Chen, Chengdu, CN;

Mow Huat Goh, Singapore, SG;

Kien Kia Tan, Singapore, SG;

Assignee:

ASMPT SINGAPORE PTE. LTD., Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/62 (2006.01); G01B 5/14 (2006.01); G01N 3/24 (2006.01); G01N 19/04 (2006.01);
U.S. Cl.
CPC ...
G01N 3/62 (2013.01);
Abstract

An apparatus for calibrating a shear test tool utilizes a resilient pivot mechanism to improve accuracy and reliability of the force calibration. The apparatus includes a fixed element, a pivotable element configured to be rotatable relative to the fixed element, and a resilient pivot mechanism coupled between the fixed element and the pivotable element to form a pivot. The pivotable element is rotatable about the pivot to lift a weight coupled to the pivotable element when the shear test tool applies a force on the pivotable element in order to rotate the pivotable element and lift the weight.


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