The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2025
Filed:
Nov. 30, 2022
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Wenwen Chai, Sunnyvale, CA (US);
Li Ding, San Jose, CA (US);
Assignee:
SYNOPSYS, INC., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/20 (2020.01); G06F 30/3308 (2020.01); G06F 30/3323 (2020.01); G06F 30/398 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/3323 (2020.01); G06F 30/20 (2020.01); G06F 30/3308 (2020.01); G06F 30/398 (2020.01);
Abstract
A set of global parameters may be modeled using a set of equivalent parameters, where the set of global parameters represents global process variation in a circuit. A global distribution for a metric in the circuit may be determined by performing Monte-Carlo (MC) analysis using the set of equivalent parameters. Combined local and global variations for the metric may be calculated based on the global distribution for the metric and a local distribution for the metric.