The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2025

Filed:

Jul. 08, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Chih-Wei Wen, Tainan, TW;

Hsin-Fu Tseng, Hsinchu County, TW;

Chien-Lin Chen, Tainan, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/84 (2012.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 1/84 (2013.01); G03F 7/702 (2013.01); G03F 7/70608 (2013.01);
Abstract

An inspection apparatus includes: an inspection apparatus includes: a stage configured to receive a photomask; a radiation source configured to emit a first radiation beam for inspecting the photomask; and an aperture stop configured to receive a second radiation beam reflected from the photomask through an aperture of the aperture stop, wherein the aperture is tangent at a center of the aperture stop.


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