The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2025

Filed:

Sep. 14, 2021
Applicant:

Adeia Semiconductor Inc., San Jose, CA (US);

Inventors:

Steven L. Teig, Menlo Park, CA (US);

Ilyas Mohammed, Santa Clara, CA (US);

Kenneth Duong, San Jose, CA (US);

Javier Delacruz, San Jose, CA (US);

Assignee:

Adeia Semiconductor Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10B 41/20 (2023.01); H01L 23/00 (2006.01); H01L 25/065 (2023.01); H01L 25/18 (2023.01); H01L 25/04 (2023.01); H01L 25/07 (2006.01); H01L 25/075 (2006.01); H01L 25/10 (2006.01); H01L 25/11 (2006.01); H01L 25/16 (2023.01); H10B 51/20 (2023.01); H10B 53/20 (2023.01); H10B 63/00 (2023.01); H10D 88/00 (2025.01); H10K 19/00 (2023.01);
U.S. Cl.
CPC ...
H01L 25/18 (2013.01); H01L 24/92 (2013.01); H01L 25/0657 (2013.01); H01L 24/03 (2013.01); H01L 24/08 (2013.01); H01L 24/11 (2013.01); H01L 24/16 (2013.01); H01L 24/32 (2013.01); H01L 24/80 (2013.01); H01L 25/043 (2013.01); H01L 25/074 (2013.01); H01L 25/0756 (2013.01); H01L 25/105 (2013.01); H01L 25/117 (2013.01); H01L 25/16 (2013.01); H01L 2224/08145 (2013.01); H01L 2224/16145 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/17181 (2013.01); H01L 2224/32145 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2224/9202 (2013.01); H01L 2225/06503 (2013.01); H01L 2225/06548 (2013.01); H10B 41/20 (2023.02); H10B 51/20 (2023.02); H10B 53/20 (2023.02); H10B 63/84 (2023.02); H10D 88/00 (2025.01); H10K 19/201 (2023.02);
Abstract

Some embodiments of the invention provide a three-dimensional (3D) circuit that is formed by vertically stacking two or more integrated circuit (IC) dies to at least partially overlap. In this arrangement, several circuit blocks defined on each die (1) overlap with other circuit blocks defined on one or more other dies, and (2) electrically connect to these other circuit blocks through connections that cross one or more bonding layers that bond one or more pairs of dies. In some embodiments, the overlapping, connected circuit block pairs include pairs of computation blocks and pairs of computation and memory blocks. The connections that cross bonding layers to electrically connect circuit blocks on different dies are referred to below as z-axis wiring or connections. This is because these connections traverse completely or mostly in the z-axis of the 3D circuit, with the x-y axes of the 3D circuit defining the planar surface of the IC die substrate or interconnect layers. These connections are also referred to as vertical connections to differentiate them from the horizontal planar connections along the interconnect layers of the IC dies.


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