The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Jan. 08, 2024
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Yu-Chung Lien, San Jose, CA (US);
Zhenming Zhou, San Jose, CA (US);
Tomer Tzvi Eliash, Sunnyvale, CA (US);
Assignee:
MICRON TECHNOLOGY, INC., Boise, ID (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0625 (2013.01); G06F 3/0634 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01);
Abstract
Methods, systems, and apparatuses include determining to apply a read retry operation to a portion of memory. The likelihood of a read retry timeout meeting a threshold is determined. A reverse trim setting is selected in response to determining the likelihood of the read retry timeout meets the threshold. The read retry operation is executed using the selected trim setting.