The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Feb. 12, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mustafa N. Kaynak, San Diego, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
H03M 13/1108 (2013.01); H03M 13/1128 (2013.01); H03M 13/1575 (2013.01);
Abstract

Methods, systems, and apparatuses detect and mitigate a stall condition in an iterative bit flipping decoder. A codeword is received and one or more of the bits in the codeword are flipped in each of multiple iterations of bit flipping decoding using a first set of bit flipping rules. Each of the iterations includes a determination of a syndrome weight. In response to determining a count of iterations in which the syndrome weight increased satisfies a threshold, one or more of the bits in the codeword are flipped in a subsequent iteration using a second set of bit flipping rules that differs from the first set of bit flipping rules.


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