The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Feb. 22, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Yee Yang Tay, Singapore, SG;

Lei Zhang, Singapore, SG;

Steve Kientz, Westminster, CO (US);

Edric Goh, Singapore, SG;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0604 (2013.01); G06F 3/0629 (2013.01); G06F 3/0679 (2013.01);
Abstract

Methods, apparatuses and systems related to tracking charge loss are described. An apparatus may include a tracking mechanism configured to make direct measurements for tracking charge loss in first-type cells. The apparatus may be configured to designate a set of the first-type cells as proxy for modeling charge loss at second-type cells having a different storage density than the first-type cells. The apparatus may use the tracking mechanism to make measurements on the proxy set of the first-type cells and translate the measurement to account for the charge loss at the second-type cells.


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