The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Jan. 31, 2019
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Ivo Vellekoop, Enschede, NL;

Tzu-Lun Wang, Duisburg, DE;

Bahareh Mastiani, Hengelo, NL;

Kai Wicker, Jena, DE;

Christoph Husemann, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/0048 (2013.01); G02B 21/0076 (2013.01);
Abstract

An apparatus and method for manipulating a focus of excitation light on or in a sample, particularly in a microscope. The apparatus has a light source for emitting excitation light, an excitation beam path for guiding the excitation light onto or into the sample, the excitation beam path comprising an objective for guiding the excitation light onto or into the sample and a wavefront modulator for modulating the excitation light, and a control device for driving the wavefront modulator. The control device is designed for driving the wavefront modulator to generate a number of shaped waves on or in the sample. A focus is generated at a specified location on or in the sample by superposition of the shaped waves.


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