The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Sep. 14, 2018
Applicant:

Illumina, Inc., San Diego, CA (US);

Inventors:

Jeffrey G. Mandell, San Diego, CA (US);

Kevin L. Gunderson, San Diego, CA (US);

Michael Gregory Keehan, San Diego, CA (US);

Erin Christine Garcia, San Diego, CA (US);

Jens H. Gundlach, San Diego, CA (US);

Assignee:

ILLUMINA, INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/68 (2006.01); G16B 40/10 (2019.01);
U.S. Cl.
CPC ...
G01N 33/6818 (2013.01); G16B 40/10 (2019.02);
Abstract

The current document discusses a detection system comprising a mechanical-change sensor that exhibits one or more mechanical changes when specifically interacting with entities within a target, each entity having a type, a mechanical-change-to-signal transducer that transduces the one or more mechanical changes into a signal, and an analysis subsystem that determines the types of entities within the target using the signal.


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