The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Mar. 24, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Stephen W. Russell, Boise, ID (US);

Enrico Varesi, Milan, IT;

David H. Wells, Boise, ID (US);

Paolo Fantini, Vimercate, IT;

Lorenzo Fratin, Buccinasco, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10B 63/10 (2023.01); G11C 13/00 (2006.01); H10B 63/00 (2023.01); H10D 64/01 (2025.01); H10N 70/00 (2023.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H10N 70/826 (2023.02); G11C 13/0028 (2013.01); H10B 63/84 (2023.02); H10D 64/017 (2025.01); H10N 70/021 (2023.02); H10N 70/841 (2023.02); H10N 70/882 (2023.02); G11C 13/003 (2013.01); G11C 2213/71 (2013.01); G11C 2213/78 (2013.01); H01L 21/02507 (2013.01); H10B 63/10 (2023.02); H10B 63/845 (2023.02);
Abstract

Methods, systems, and devices for sparse piers for three-dimensional memory arrays are described. A semiconductor device, such as a memory die, may include pier structures formed in contact with features formed from alternating layers of materials deposited over a substrate, which may provide mechanical support for subsequent processing. For example, a memory die may include alternating layers of a first material and a second material, which may be formed into various cross-sectional patterns. In some examples, the alternating layers may be formed into one or more pairs of interleaved comb structures. Pier structures may be formed in contact with the cross sectional patterns to provide mechanical support between instances of the cross-sectional patterns, or between layers of the cross-sectional patterns (e.g., when one or more layers are removed from the cross-sectional patterns), or both.


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