The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jul. 20, 2022
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chun-Chieh Lu, Taipei, TW;

Sai-Hooi Yeong, Zhubei, TW;

Bo-Feng Young, Taipei, TW;

Yu-Ming Lin, Hsinchu, TW;

Han-Jong Chia, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); G11C 11/22 (2006.01); H01L 21/84 (2006.01); H10B 51/20 (2023.01); H10B 51/30 (2023.01); H10D 30/01 (2025.01); H10D 30/69 (2025.01); H10D 64/01 (2025.01); H10D 64/68 (2025.01); H10D 86/00 (2025.01); H10D 86/01 (2025.01); H10D 87/00 (2025.01);
U.S. Cl.
CPC ...
H10D 86/201 (2025.01); G11C 11/223 (2013.01); H10B 51/20 (2023.02); H10B 51/30 (2023.02); H10D 30/0415 (2025.01); H10D 30/701 (2025.01); H10D 64/017 (2025.01); H10D 64/033 (2025.01); H10D 64/689 (2025.01); H10D 86/01 (2025.01); H01L 2924/1441 (2013.01); H10D 86/215 (2025.01); H10D 87/00 (2025.01);
Abstract

A method for forming a memory device includes: forming a first layer stack and a second layer stack successively over a substrate, wherein each of the first and the second layer stacks comprises a dielectric layer, a channel layer, and a source/drain layer formed successively over the substrate; forming openings that extend through the first layer stack and the second layer stack, where the openings include first openings within boundaries of the first and the second layer stacks, and a second opening extending from a sidewall of the second layer stack toward the first openings; forming inner spacers by replacing portions of the source/drain layer exposed by the openings with a dielectric material; lining sidewalls of the openings with a ferroelectric material; and forming first gate electrodes in the first openings and a dummy gate electrode in the second opening by filling the openings with an electrically conductive material.


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