The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Feb. 01, 2019
Applicant:

Institute of Microelectronics, Chinese Academy of Sciences, Beijing, CN;

Inventors:

Lina Shi, Beijing, CN;

Longjie Li, Beijing, CN;

Kaiping Zhang, Beijing, CN;

Jiebin Niu, Beijing, CN;

Changqing Xie, Beijing, CN;

Ming Liu, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/12 (2005.12); B82Y 40/00 (2010.12); G02B 1/02 (2005.12); G02B 1/118 (2014.12); G03F 7/00 (2005.12);
U.S. Cl.
CPC ...
G02B 1/12 (2012.12); B82Y 40/00 (2012.12); G02B 1/02 (2012.12); G02B 1/118 (2012.12); G03F 7/70316 (2012.12); G02B 2207/101 (2012.12);
Abstract

The present disclosure provides a method for fabricating an anti-reflective layer on a quartz surface by using a metal-induced self-masking etching technique, comprising: performing reactive ion etching to a metal material and a quartz substrate by using a mixed gas containing a fluorine-based gas, wherein metal atoms and/or ions of the metal material are sputtered to a surface of the quartz substrate, to form a non-volatile metal fluoride on the surface of the quartz substrate; forming a micromask by a product of etching generated by reactive ion etching gathering around the non-volatile metal fluoride; and etching the micromask and the quartz substrate simultaneously, to form an anti-reflective layer having a sub-wavelength structure.


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