The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2025

Filed:

Feb. 14, 2022
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Shi-Han Zhang, Hsinchu, TW;

You-Cheng Lai, Hsinchu, TW;

Jerry Chang Jui Kao, Taipei, TW;

Pei-Wei Liao, Hsinchu, TW;

Shang-Chih Hsieh, Taoyuan County, TW;

Meng-Kai Hsu, Hsinchu County, TW;

Chih-Wei Chang, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3312 (2019.12); G03F 1/70 (2011.12); G06F 30/392 (2019.12); G06F 30/394 (2019.12); G06F 119/12 (2019.12);
U.S. Cl.
CPC ...
G06F 30/3312 (2019.12); G03F 1/70 (2012.12); G06F 30/392 (2019.12); G06F 30/394 (2019.12); G06F 2119/12 (2019.12);
Abstract

A method including: providing a design data of an integrated circuit (IC), the design data comprising a first cell; identifying a first conductive line in the first cell as a critical internal net of the first cell, wherein the first conductive line is electrically connected between an input terminal of the first cell and an output terminal of the first cell; providing a library of the first cell, wherein the library includes a table of timing or power parameters of the first cell based on a multidimensional input set associated with the critical internal net; updating the design data by determining a timing or power value of the first cell based on the table; performing a timing analysis on the updated design data; and forming a photomask based on the updated design data.


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