The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jul. 12, 2021
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventors:

Jianping Wang, Hefei, CN;

Chien-Hung Chen, Hefei, CN;

Jinjin Cao, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2005.12); H01L 21/67 (2005.12); H01L 21/677 (2005.12);
U.S. Cl.
CPC ...
G05B 19/41865 (2012.12); H01L 21/677 (2012.12); G05B 2219/32086 (2012.12); H01L 21/67167 (2012.12);
Abstract

The present application relates to the technical field of semiconductors, and in particular, to a wafer scheduling method and a wafer scheduling apparatus for an etching equipment. The wafer scheduling method includes: obtaining a wafer processing request, where the wafer processing request includes at least process information of wafers and an equipment processing parameter of the etching equipment; responding to the wafer processing request, and determining a wafer scheduling parameter corresponding to the process information and the equipment processing parameter, based on the process information, the equipment processing parameter, and a preset wafer scheduling policy, where the wafer scheduling parameter is used to determine a transfer time for transferring the wafers to the etching equipment for processing; and performing wafer scheduling processing on the wafers by using the wafer scheduling parameter. In this way, the wafer processing productivity of the etching equipment can be improved.


Find Patent Forward Citations

Wang, Jianping. (2025). Wafer scheduling method and wafer scheduling apparatus for etching equipment (U.S. Patent No. 12276972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12276972

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…