The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Apr. 08, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Christopher S. Olsen, Fremont, CA (US);

Rene George, San Carlos, CA (US);

Tsung-Han Yang, San Jose, CA (US);

David Knapp, Santa Clara, CA (US);

Lara Hawrylchak, Gilroy, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 8/12 (2006.01); C23C 8/36 (2006.01); H01L 21/02 (2006.01); H10B 69/00 (2023.01);
U.S. Cl.
CPC ...
H01J 37/32816 (2013.01); C23C 8/12 (2013.01); C23C 8/36 (2013.01); H01J 37/321 (2013.01); H01J 37/32357 (2013.01); H01J 37/3244 (2013.01); H01L 21/0223 (2013.01); H01L 21/02238 (2013.01); H01L 21/02252 (2013.01); H10B 69/00 (2023.02);
Abstract

A method and apparatus for growing an oxide layer within a feature of a substrate is described herein. The method is suitable for use in semiconductor manufacturing. The oxide layer is formed by exposing a substrate to both a high pressure oxidant exposure and a lower pressure oxygen containing plasma exposure. The high pressure oxidant exposure is performed at a pressure of greater than 10 Torr, while the lower pressure oxygen containing plasma exposure is performed at a pressure of less than about 10 Torr. The features are high-aspect ratio trenches or holes within a stack of silicon oxide and silicon nitride layers.


Find Patent Forward Citations

Olsen, Christopher. (2025). Dual pressure oxidation method for forming an oxide layer in a feature (U.S. Patent No. 12272531). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12272531

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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