The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2025

Filed:

Jul. 05, 2023
Applicant:

Adeia Semiconductor Technologies Llc, San Jose, CA (US);

Inventors:

Javier A. DeLaCruz, San Jose, CA (US);

Richard E. Perego, Thornton, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/065 (2023.01); H01L 23/00 (2006.01); H01L 23/48 (2006.01);
U.S. Cl.
CPC ...
H01L 25/0652 (2013.01); H01L 23/481 (2013.01); H01L 24/33 (2013.01); H01L 2224/32225 (2013.01);
Abstract

A microelectronic assembly may include a semiconductor wafer having first and second surfaces extending in first and second directions, the semiconductor wafer having network nodes connected to one another via local adjacent connections each extending in only one of the first and second directions, and an interconnection structure comprising a low-loss dielectric material and having first and second opposite surfaces extending in third and fourth directions each oriented at an oblique angle relative to the first and second directions, the interconnection structure having local oblique connections each extending in only one of the third and fourth directions. The semiconductor wafer may be directly bonded to the interconnection structure such that each of the network nodes is connected with at least one of the other network nodes, without use of conductive bonding material, through at least one of the local adjacent connections and at least one of the local oblique connections.


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