The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2025
Filed:
Oct. 04, 2021
Applicant:
Applied Materials, Inc., Santa Clara, CA (US);
Inventors:
Yangyang Sun, San Jose, CA (US);
Jinxin Fu, Fremont, CA (US);
Kazuya Daito, Milpitas, CA (US);
Ludovic Godet, Sunnyvale, CA (US);
Assignee:
Applied Materials, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01J 1/42 (2006.01); G01J 1/44 (2006.01); G01N 21/958 (2006.01); G02B 27/01 (2006.01); G06T 7/80 (2017.01); G06T 7/90 (2017.01); H04N 23/56 (2023.01); H04N 23/74 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01J 1/42 (2013.01); G01J 1/44 (2013.01); G01N 21/958 (2013.01); G02B 27/0172 (2013.01); G06T 7/80 (2017.01); G06T 7/90 (2017.01); H04N 23/56 (2023.01); H04N 23/74 (2023.01); H04N 23/90 (2023.01); G01J 2001/4247 (2013.01); G01N 2021/9583 (2013.01); G02B 2027/0112 (2013.01); G02B 2027/0118 (2013.01); G02B 2027/0138 (2013.01); G02B 2027/014 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30108 (2013.01);
Abstract
Embodiments of the present disclosure relate to optical devices for augmented, virtual, and/or mixed reality applications. In one or more embodiments, an optical device metrology system is configured to measure a plurality of first metrics and one or more second metrics for optical devices, the one or more second metrics including a display leakage metric.