The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2025

Filed:

Sep. 22, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Kumar Lalgudi, Fremont, CA (US);

Ranjith Kumar, Hsinchu, TW;

Mohammed Rabiul Islam, Austin, TX (US);

Jianyang Xu, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/337 (2020.01); G06F 30/373 (2020.01); G06F 30/392 (2020.01); G06F 30/398 (2020.01); G06F 119/06 (2020.01); G06F 119/12 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/373 (2020.01); G06F 30/392 (2020.01); G06F 30/337 (2020.01); G06F 30/398 (2020.01); G06F 2119/06 (2020.01); G06F 2119/12 (2020.01);
Abstract

A method of forming an integrated circuit structure is provided. The method includes: providing a logic cell structure including a first input node, a second input node, and a pulling network connected to a reference voltage and an output node, wherein the pulling network includes a plurality of transistor segments; determining a delay associated with at least one of the first input node and the second input node; and connecting the plurality of transistor segments to the first input node, the second input node and the output node based at least in part on the determined delay.


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