The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Jul. 26, 2023
Marvell Asia Pte Ltd, Singapore, SG;
Sreekanth G. Pai, Cochin, IN;
Harry I. Linzer, Raleigh, NC (US);
Harish Mundrathi, Bangalore, IN;
Santosh Kumar Surendra, Bangalore, IN;
Marvell Asia Pte Ltd, Singapore, SG;
Abstract
A method of testing an integrated circuit device that includes components of first and second types, where the components of the second type consume power when clocked even when not active, includes gating off the clock signal to prevent clock signals from reaching the components of the second type, and applying test inputs to the components of the first type. Gating off the clock signals to the components of the second type may include preventing the clock signals from reaching individual components of the second type, or preventing the clock signals from reaching each clock tree branch that contains only components of the second type, or, when a clock tree serving the components of the second type supplies clock signals only to the components of the second type, preventing the clock signals from reaching the clock tree.