The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Apr. 03, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jung-Gil Yang, Hwaseong-si, KR;

Geum-Jong Bae, Suwon-si, KR;

Dong-Il Bae, Seongnam-si, KR;

Seung-Min Song, Hwaseong-si, KR;

Woo-Seok Park, Ansan-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 21/8234 (2006.01); H01L 21/8238 (2006.01); H01L 27/088 (2006.01); H01L 29/06 (2006.01); H01L 29/41 (2006.01); H01L 29/66 (2006.01); H01L 29/775 (2006.01); H01L 29/786 (2006.01); H01L 29/165 (2006.01); H01L 29/20 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0924 (2013.01); H01L 21/823456 (2013.01); H01L 21/823468 (2013.01); H01L 21/82385 (2013.01); H01L 21/823864 (2013.01); H01L 27/088 (2013.01); H01L 27/092 (2013.01); H01L 29/0669 (2013.01); H01L 29/0673 (2013.01); H01L 29/413 (2013.01); H01L 29/66439 (2013.01); H01L 29/66742 (2013.01); H01L 29/66772 (2013.01); H01L 29/775 (2013.01); H01L 29/78696 (2013.01); H01L 21/823412 (2013.01); H01L 21/823807 (2013.01); H01L 29/0646 (2013.01); H01L 29/0653 (2013.01); H01L 29/165 (2013.01); H01L 29/20 (2013.01); H01L 29/42392 (2013.01); H01L 29/7853 (2013.01); H01L 2924/13086 (2013.01);
Abstract

A semiconductor device includes a first transistor in a first region of a substrate and a second transistor in a second region of the substrate. The first transistor includes multiple first semiconductor patterns; a first gate electrode; a first gate dielectric layer; a first source/drain region; and an inner-insulating spacer. The second transistor includes multiple second semiconductor patterns; a second gate electrode; a second gate dielectric layer; and a second source/drain region. The second gate dielectric layer extends between the second gate electrode and the second source/drain region and is in contact with the second source/drain region. The first source/drain region is not in contact with the first gate dielectric layer.


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