The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2025

Filed:

Nov. 09, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Po-Cheng Shih, Hsin Chiu, TW;

Tze-Liang Lee, Hsinchu, TW;

Jen-Hung Wang, Hsinchu County, TW;

Yu-Kai Lin, Changhua County, TW;

Su-Jen Sung, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/02 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76832 (2013.01); H01L 21/76802 (2013.01); H01L 21/76834 (2013.01); H01L 23/53238 (2013.01); H01L 23/53295 (2013.01); H01L 21/02126 (2013.01); H01L 21/02167 (2013.01); H01L 21/02178 (2013.01); H01L 21/02274 (2013.01); H01L 21/0228 (2013.01); H01L 21/02315 (2013.01); H01L 21/0234 (2013.01); H01L 23/5226 (2013.01);
Abstract

A semiconductor device structure is provided. The semiconductor device structure includes a first diffusion barrier layer made of a dielectric material including a metal element, nitrogen, and oxygen and a first protection layer made of a dielectric material including silicon and oxygen and in direct contact with the top surface of the first diffusion barrier layer. The semiconductor device structure also includes a first thickening layer made of a dielectric material including the metal element and oxygen and in direct contact with the top surface of the first protection layer. A maximum metal content in the first thickening layer is greater than that in the first diffusion barrier layer. The semiconductor device structure further includes a conductive feature surrounded by and in direct contact with the first diffusion barrier layer, the first protection layer, and the first thickening layer.


Find Patent Forward Citations

Loading…