The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2024
Filed:
Sep. 21, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 7/501 (2006.01); G06F 11/07 (2006.01); G11C 29/44 (2006.01); G11C 29/52 (2006.01); H03M 13/11 (2006.01); H03M 13/15 (2006.01); H03M 13/29 (2006.01); H03M 13/37 (2006.01); H03M 13/45 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 7/501 (2013.01); G06F 11/076 (2013.01); G06F 11/0793 (2013.01); G11C 29/44 (2013.01); G11C 29/52 (2013.01); H03M 13/1108 (2013.01); H03M 13/1111 (2013.01); H03M 13/151 (2013.01); H03M 13/2948 (2013.01); H03M 13/3746 (2013.01); H03M 13/45 (2013.01);
Abstract
A method includes determining a quantity of errors for a bit string based on a quantity of bits having a logical value of one within the bit string and writing an indication corresponding to the quantity of errors for the bit string to an array of memory cells. The method can further include determining that the quantity of errors for the bit string has reached a threshold quantity of errors and refraining from performing a subsequent operation to determine the quantity of errors for the bit string in response to determining that the quantity of errors for the bit string has reached the threshold quantity of errors.