The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2024
Filed:
Feb. 10, 2021
Stratasys, Inc., Eden Prairie, MN (US);
Joel Ong, San Francisco, CA (US);
Christopher Prucha, San Francisco, CA (US);
Steve Kranz, Oakland, CA (US);
Eduardo González-Maldonado, San Francisco, CA (US);
Stratasys, Inc., Eden Prairie, MN (US);
Abstract
A method includes: accessing a first selection of a first test variable; based on the selection, photocuring a first test build by varying a value of the first test variable over a first set of test regions; accessing a first set of measurements of the first test build; calculating a target range of the first test variable based on the first set of measurements; accessing a second selection of a second test variable; based on the second selection, photocuring a second test build by varying a value of the second test variable over a second set of test regions while maintaining a target value of the first test variable within the target range of the first test variable; accessing a second set of measurements of the second test build; and calculating a second target range of the second test variable based on the second set of measurements.