The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2024

Filed:

Jul. 31, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Te-Yang Lai, Hsinchu, TW;

Chun-Yen Peng, Hsinchu, TW;

Chih-Yu Chang, Hsinchu, TW;

Bo-Feng Young, Hsinchu, TW;

Sai-Hooi Yeong, Zhubei, TW;

Chi On Chui, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/51 (2006.01); H01L 21/266 (2006.01); H01L 21/28 (2006.01); H01L 21/3105 (2006.01); H01L 21/311 (2006.01); H01L 21/762 (2006.01); H01L 21/8238 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 29/516 (2013.01); H01L 21/28185 (2013.01); H01L 21/823821 (2013.01); H01L 21/823857 (2013.01); H01L 29/42364 (2013.01); H01L 29/517 (2013.01); H01L 29/6684 (2013.01); H01L 29/78391 (2014.09); H01L 21/266 (2013.01); H01L 21/31053 (2013.01); H01L 21/31111 (2013.01); H01L 21/76224 (2013.01); H01L 21/823878 (2013.01); H01L 29/66545 (2013.01);
Abstract

Negative capacitance field-effect transistor (NCFET) and ferroelectric field-effect transistor (FE-FET) devices and methods of forming are provided. The gate dielectric stack includes a ferroelectric gate dielectric layer. An amorphous high-k dielectric layer and a dopant-source layer are deposited sequentially followed by a post-deposition anneal (PDA). The PDA converts the amorphous high-k layer to a polycrystalline high-k film with crystalline grains stabilized by the dopants in a crystal phase in which the high-k dielectric is a ferroelectric high-k dielectric. After the PDA, the remnant dopant-source layer may be removed. A gate electrode is formed over remnant dopant-source layer (if present) and the polycrystalline high-k film.


Find Patent Forward Citations

Lai, Te-Yang. (2024). Negative-capacitance and ferroelectric field-effect transistor (ncfet and fe-fet) devices (U.S. Patent No. 12136659). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12136659

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…