The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Jun. 09, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Jong Sik Paek, Taichung, TW;

Po Chih Yang, Taichung, TW;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); H01L 23/31 (2006.01); H01L 25/00 (2006.01); H01L 25/065 (2023.01); H01L 25/10 (2006.01);
U.S. Cl.
CPC ...
H01L 24/20 (2013.01); H01L 23/3107 (2013.01); H01L 24/19 (2013.01); H01L 24/48 (2013.01); H01L 24/85 (2013.01); H01L 25/0657 (2013.01); H01L 25/105 (2013.01); H01L 25/50 (2013.01); H01L 2224/211 (2013.01); H01L 2224/48147 (2013.01); H01L 2224/48225 (2013.01); H01L 2225/06506 (2013.01); H01L 2225/0651 (2013.01);
Abstract

A semiconductor device assembly is provided. The assembly includes a redistribution layer (RDL) including a plurality of external contacts on a first side and a plurality of internal contacts on a second side opposite the first side. The assembly further includes a first die at least partially embedded in the RDL and having an active surface between the first side and the second side of the RDL. The assembly further includes one or more second dies disposed over the controller die and the RDL, wherein the one or more second dies electrically coupled to the internal contacts. The assembly further includes an encapsulant at least partially encapsulating the one or more second dies.


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