The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 22, 2024

Filed:

Jun. 08, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chun-Yen Peng, Hsinchu, TW;

Te-Yang Lai, Hsinchu, TW;

Sai-Hooi Yeong, Zhubei, TW;

Chi On Chui, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); H01L 21/02 (2006.01); H01L 21/3115 (2006.01); H01L 21/8234 (2006.01); H01L 29/51 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28185 (2013.01); H01L 21/02356 (2013.01); H01L 21/28158 (2013.01); H01L 21/3115 (2013.01); H01L 21/823431 (2013.01); H01L 21/823462 (2013.01); H01L 29/517 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01);
Abstract

A nano-crystalline high-k film and methods of forming the same in a semiconductor device are disclosed herein. The nano-crystalline high-k film may be initially deposited as an amorphous matrix layer of dielectric material and self-contained nano-crystallite regions may be formed within and suspended in the amorphous matrix layer. As such, the amorphous matrix layer material separates the self-contained nano-crystallite regions from one another preventing grain boundaries from forming as leakage and/or oxidant paths within the dielectric layer. Dopants may be implanted in the dielectric material and crystal phase of the self-contained nano-crystallite regions may be modified to change one or more of the permittivity of the high-k dielectric material and/or a ferroelectric property of the dielectric material.


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