The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2024

Filed:

Jun. 26, 2023
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Peter F. Kurunczi, Cambridge, MA (US);

Morgan Evans, Manchester, MA (US);

Joseph C. Olson, Beverly, MA (US);

Christopher A. Rowland, Rockport, MA (US);

James Buonodono, Amesbury, MA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01J 37/08 (2006.01); H01J 37/305 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3053 (2013.01); H01J 37/08 (2013.01); H01J 37/20 (2013.01); H01J 2237/0041 (2013.01); H01J 2237/0822 (2013.01); H01J 2237/20228 (2013.01); H01J 2237/3174 (2013.01);
Abstract

A system may include a substrate stage, configured to support a substrate, where a main surface of the substrate defines a substrate plane. The system may include an ion source, including an extraction assembly that is oriented to direct an ion beam to the substrate along a trajectory defining a non-zero angle of incidence with respect to a perpendicular to the substrate plane. The system may include a radical source oriented to direct a radical beam to the substrate along a trajectory defining the non-zero angle of incidence with respect to a perpendicular to the substrate plane. The substrate stage may be further configured to scan the substrate along a first direction, lying with the substrate plane, while the main surface of the substrate is oriented within the substrate plane.


Find Patent Forward Citations

Loading…