The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
Apr. 13, 2023
Synopsys, Inc., Sunnyvale, CA (US);
Grigor Tshagharyan, Yerevan, AM;
Gurgen Harutyunyan, Yerevan, AM;
Yervant Zorian, Santa Clara, CA (US);
Synopsys, Inc., Sunnyvale, CA (US);
Abstract
Methods for diagnosing faults in memory periphery circuitry, computer readable media, and a test device for the same are provided. In one example, method is provided that includes receiving, at a test device, a first test syndrome from a memory device, the first test syndrome corresponds to a first test process executed by the memory device, wherein the memory device comprises a memory array and peripheral circuitry, and wherein the first test process is associated with a first circuit element of the peripheral circuitry; determining, by a processing device of the test device, a first fault associated with the first circuit element based on the first test syndrome; and diagnosing, by the processing device, the first fault to determine positional information of the first fault, the positional information is associated with the first circuit element.