The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Jan. 09, 2023
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Ke-Ming Chen, Hsinchu, TW;

Ting-Jung Chang, Hsinchu, TW;

Hsin-Chen Cheng, Hsinchu, TW;

Chih-Tsang Tseng, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); G11C 5/06 (2006.01); H01L 21/02 (2006.01); H01L 21/768 (2006.01); H01L 21/8238 (2006.01); H01L 29/40 (2006.01); H10B 10/00 (2023.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823418 (2013.01); G11C 5/06 (2013.01); H01L 21/02057 (2013.01); H01L 21/76895 (2013.01); H01L 21/76897 (2013.01); H01L 21/823475 (2013.01); H01L 21/823814 (2013.01); H01L 29/401 (2013.01); H10B 10/12 (2023.02); H01L 21/823431 (2013.01); H01L 29/41783 (2013.01);
Abstract

A method of forming a semiconductor structure is provided. The method includes forming a gate structure over an active region of a substrate, forming an epitaxial layer comprising first dopants of a first conductivity type over portions of the active region on opposite sides of the gate structure, the epitaxial layer, applying a cleaning solution comprising ozone and deionized water to the epitaxial layer, thereby forming an oxide layer on the epitaxial layer, forming a patterned photoresist layer over the oxide layer and the gate structure to expose a portion of the oxide layer, forming a contact region second dopants of a second conductivity type opposite the first conductivity type in the portion of the epitaxial layer not covered by the patterned photoresist layer, and forming a contact overlying the contact region.


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