The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2024

Filed:

Mar. 20, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Huixiong Dai, San Jose, CA (US);

Srinivas D. Nemani, Sunnyvale, CA (US);

Steven Hiloong Welch, Milpitas, CA (US);

Mangesh Ashok Bangar, San Jose, CA (US);

Ellie Y. Yieh, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/16 (2006.01); G03F 7/38 (2006.01); H01L 21/027 (2006.01); H01L 21/266 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
G03F 7/20 (2013.01); G03F 7/16 (2013.01); G03F 7/38 (2013.01); H01L 21/0273 (2013.01); H01L 21/266 (2013.01); H01L 21/31133 (2013.01);
Abstract

A method for enhancing a photoresist profile control includes applying a photoresist layer comprising a photoacid generator on an underlayer disposed on a material layer, exposing a first portion of the photoresist layer unprotected by a photomask to light radiation in a lithographic exposure process, providing a thermal energy to the photoresist layer in a post-exposure baking process, applying an electric field or a magnetic field while performing the post-exposure baking process, and drifting photoacid from the photoresist layer to a predetermined portion of the underlayer under the first portion of the photoresist layer.


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