The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2024
Filed:
Sep. 28, 2021
Applied Materials, Inc., Santa Clara, CA (US);
Bruce E. Adams, Portland, OR (US);
Samuel C. Howells, Portland, OR (US);
Alvaro Garcia, Mountain View, CA (US);
Barry P. Craver, Sunnyvale, CA (US);
Tony Jefferson Gnanaprakasa, Mountain View, CA (US);
Lei Lian, Fremont, CA (US);
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
A method and apparatus for determining the temperature of a substrate within a processing chamber are described herein. The methods and apparatus described herein utilize an etalon assembly and a heterodyning effect to determine a first temperature of a substrate. The first temperature of the substrate is determined without physically contacting the substrate. A separate temperature sensor also measures a second temperature of the substrate and/or the substrate support at a similar location. The first temperature and the second temperature are utilized to calibrate one of the temperature sensors disposed within the substrate support, a model of the processes performed within the processing chamber, or to adjust a process parameter of the process performed within the processing chamber.