The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

May. 08, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Yu-Jheng Ou-Yang, Hsinchu, TW;

Chi-Lin Liu, New Taipei, TW;

Shang-Chih Hsieh, Taoyuan, TW;

Wei-Hsiang Ma, Taipei, TW;

Kai-Chi Huang, Taichung, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/037 (2006.01); H03K 3/3562 (2006.01);
U.S. Cl.
CPC ...
H03K 3/0372 (2013.01); H03K 3/0375 (2013.01); H03K 3/35625 (2013.01);
Abstract

The present disclosure provides a semiconductor device which includes a multiplexer, a master latch, and a slave latch. The multiplexer outputs an inverse of an input data signal or an inverse scan input signal according to a scan enable signal. The master latch is coupled to an output terminal of the multiplexer, and is configured to latch the inverse of the input data signal based on an input clock signal in response to the scan enable signal being in a low-logic state. The slave latch is coupled to the output terminal of the multiplexer through a first clocked CMOS inverter, and is configured to receive the input data signal and to output a latched slave latch data based on the input clock signal. A leakage-free dummy cell is disposed in a non-critical path of the master latch and the slave latch.


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