The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2024

Filed:

Jun. 26, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chunhung Chen, Hsinchu, TW;

Jung-Yu Li, Hsinchu, TW;

Sheng-Chen Wang, Hsinchu, TW;

Shih-Sian Huang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/24 (2012.01); B24B 37/005 (2012.01); B24B 37/10 (2012.01); B24B 37/22 (2012.01); B24B 37/26 (2012.01); B24B 49/12 (2006.01); B24B 53/017 (2012.01);
U.S. Cl.
CPC ...
B24B 37/26 (2013.01); B24B 37/005 (2013.01); B24B 37/10 (2013.01); B24B 37/22 (2013.01); B24B 37/24 (2013.01); B24B 49/12 (2013.01); B24B 53/017 (2013.01);
Abstract

A method of using a polishing pad includes applying a slurry to a first location on the polishing pad. The method further includes rotating the polishing pad. The method further includes spreading the slurry across a first region of the polishing pad at a first rate, wherein the first region includes a plurality of first grooves. The method further includes spreading the slurry across a second region, surrounding the first region of the polishing pad at a second rate different from the first rate, wherein the second region includes a plurality of second grooves. The method further includes spreading the slurry across a third region, surrounding the second region of the polishing pad at a third rate less than the first rate and the second rate, wherein the third region includes a plurality of third grooves.


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