The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2024

Filed:

Sep. 15, 2021
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Taro Ikeda, Yamanashi, JP;

Yuki Osada, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 14/54 (2006.01); C23C 16/455 (2006.01); C23C 16/511 (2006.01); C23C 16/52 (2006.01); C23C 16/54 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 22/24 (2013.01); C23C 14/54 (2013.01); C23C 16/45508 (2013.01); C23C 16/4558 (2013.01); C23C 16/511 (2013.01); C23C 16/52 (2013.01); C23C 16/54 (2013.01); H01J 37/32192 (2013.01); H01J 37/32935 (2013.01); H01J 37/32954 (2013.01); H01J 37/3299 (2013.01); H01L 22/12 (2013.01); H01J 37/32972 (2013.01);
Abstract

A method of controlling plasma includes providing a plasma processing apparatus that includes N microwave introducing radiators disposed in a circumferential direction of a ceiling plate of a processing container so as to introduce microwaves for generating plasma into the processing container, wherein N≥2; and M sensors and configured to monitor at least one of electron density Ne and electron temperature Te of the plasma generated in the processing container, wherein M equals to N or a multiple of N. The method further includes controlling at least one of a power and a phase of the microwaves introduced from the microwave introducing radiators based on at least one of electron density Ne and electron temperature Te of the plasma monitored by the M sensors.


Find Patent Forward Citations

Loading…