The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Feb. 26, 2021
Innoscience (Suzhou) Technology Co., Ltd., Suzhou, CN;
Chang Chen, Suzhou, CN;
Chunhua Zhou, Suzhou, CN;
Sichao Li, Suzhou, CN;
Rong Yang, Suzhou, CN;
Donghua Bai, Suzhou, CN;
Jiabiao Huang, Suzhou, CN;
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD., Suzhou, CN;
Abstract
The present invention provides a system and method for measuring an intermittent operating life (IOL) of a GaN-based device under test (DUT) is provided. The system is operable in a stressing mode, a cooling mode and a measure mode. A power regulation approach is adopted to ensure that DUT of the same thermal resistance have same temperature increase during the IOL test. The present invention eliminates the influence caused by parasitic parameters of testing circuits and the inconsistency of threshold voltage and drain-source resistance of the device itself. Through power regulation, it is the junction temperature of the device, not the housing temperature of the device, being directly controlled. Therefore, higher measurement accuracy can be achieved.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile