The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Apr. 11, 2023
Applicant:

Globalwafers Co., Ltd., Hsinchu, TW;

Inventors:

Gaurab Samanta, Brentwood, MO (US);

Parthiv Daggolu, Creve Coeur, MO (US);

Sumeet Bhagavat, St. Charles, MO (US);

Soubir Basak, Chandler, AZ (US);

Nan Zhang, O'Fallon, MO (US);

Assignee:

GlobalWafers Co., Ltd., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 15/20 (2006.01); C30B 15/10 (2006.01); C30B 15/30 (2006.01); C30B 29/06 (2006.01); C30B 30/04 (2006.01);
U.S. Cl.
CPC ...
C30B 15/20 (2013.01); C30B 15/10 (2013.01); C30B 15/30 (2013.01); C30B 15/305 (2013.01); C30B 29/06 (2013.01); C30B 30/04 (2013.01);
Abstract

A method for producing a silicon ingot includes withdrawing a seed crystal from a melt that includes melted silicon in a crucible that is enclosed in a vacuum chamber containing a cusped magnetic field. At least one process parameter is regulated in at least two stages, including a first stage corresponding to formation of the silicon ingot up to an intermediate ingot length, and a second stage corresponding to formation of the silicon ingot from the intermediate ingot length to the total ingot length. During the second stage process parameter regulation may include reducing a crystal rotation rate, reducing a crucible rotation rate, and/or increasing a magnetic field strength relative to the first stage.


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