The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Jul. 06, 2022
Applicant:
Changxin Memory Technologies, Inc., Hefei, CN;
Inventors:
Yinchuan Gu, Hefei, CN;
Yadong Ye, Hefei, CN;
Assignee:
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50004 (2013.01); G11C 2029/5004 (2013.01);
Abstract
The present application relates to a chip test method and apparatus, a computer device, and a readable storage medium thereof. The chip test method includes: applying a test signal to a to-be-tested chip; and sending a data signal to the to-be-tested chip such that the to-be-tested chip enters a test mode based on the test signal and the data signal, and regulating a test voltage of the to-be-tested chip.
Gu, Yinchuan. (2024). Chip test method and apparatus, computer device, and readable storage medium thereof (U.S. Patent No. 12033712). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12033712
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile