The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2024
Filed:
Dec. 14, 2021
Wonik Ips Co., Ltd., Pyeongtaek-si, KR;
Ah Young Hwang, Pyeongtaek-si, KR;
Won Jun Jang, Seoul, KR;
Joo Suop Kim, Hwaseong-si, KR;
Kyung Park, Seoul, KR;
Sang Rok Nam, Suwon-si, KR;
Hae Jin Ahn, Hwaseong-si, KR;
Dae Seong Lee, Dongducheon-si, KR;
Chang Hun Kim, Osan-si, KR;
WONIK IPS CO., LTD., Pyeongtaek-si, KR;
Abstract
Disclosed is a substrate processing method including: a pressurizing operation of raising a process pressure from a first pressure (P) to a second pressure (P) that is greater than the atmospheric pressure; a depressurizing operation of lowering the process pressure from a sixth pressure (P), which is greater than the atmospheric pressure, to a seventh pressure (P); and an annealing operation of changing the process pressure into a preset pressure change pattern between the pressurizing operation and the depressurizing operation, under a temperature atmosphere of a second temperature (T) higher than the room temperature. A temperature raising operation of raising a temperature atmosphere from a first temperature (T) to the second temperature (T) is performed from a preset temperature raising start point (t) to a preset temperature raising end point (t) while the pressurizing operation is performed or after the pressurizing operation is performed.