The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2024

Filed:

Jan. 08, 2021
Applicant:

Comet Technologies Usa, Inc., San Jose, CA (US);

Inventors:

Stephen E. Savas, San Jose, CA (US);

Alexandre De Chambrier, San Jose, CA (US);

Assignee:

COMET TECHNOLOGIES USA, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 16/505 (2006.01); C23C 16/52 (2006.01); G01N 22/00 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3299 (2013.01); C23C 16/505 (2013.01); C23C 16/52 (2013.01); G01N 22/00 (2013.01); H01J 37/32082 (2013.01); H01J 37/32715 (2013.01); H01L 21/67253 (2013.01); H01J 2237/24564 (2013.01); H01J 2237/3345 (2013.01);
Abstract

A method of detecting non-uniformity in a plasma in a radio frequency plasma processing system, the method including generating a plasma within a reaction chamber of the radio frequency plasma processing system and detecting electrical signals from the plasma in a frequency range from a frequency of radio frequency power sustaining the plasma to a multiple of about ten times a frequency with a plurality of sensors disposed azimuthally about a chamber symmetry axis of the radio frequency plasma processing system. The method also including comparing the waveforms of the electrical signals picked up from the plasma by the plurality of sensors and determining when a plasma non-uniformity occurs based on the comparing the electrical property of the plasma detected by each of the plurality of sensors.


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